ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,215,352, issued on Feb. 4, was assigned to MESOBLAST INTERNATIONAL SARL (Meyrin, Switzerland). "Cell culture method for mesenchymal stem cells" ... Read More
ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,214,957, issued on Feb. 4, was assigned to Spokane Stainless Technologies Inc. (Spokane, Wash.). "Self-cleaning tank" was invented by Nathan Hay... Read More
ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,213,988, issued on Feb. 4, was assigned to AstraZeneca AB (Sodertalje, Sweden). "Methods of treating chronic kidney disease with dapagliflozin" ... Read More
ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,217,060, issued on Feb. 4, was assigned to Apple Inc. (Cupertino, Calif.). "Instruction fusion" was invented by Francesco Spadini (Sunset Valley... Read More
ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,217,440, issued on Feb. 4, was assigned to The Secretary of State for Defence (Salisbury, Great Britain). "Improving the resolution of a continu... Read More
ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,217,079, issued on Feb. 4, was assigned to Wiz Inc. (New York). "Detecting security exceptions across multiple compute environments" was invente... Read More
ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,214,347, issued on Feb. 4, was assigned to ELECTRONIC BIOSCIENCES INC. (San Diego). "Nanopore/nanowell electrode enabled exonuclease sequencing"... Read More
ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,218,968, issued on Feb. 4, was assigned to Board of Regents, The University of Texas System (Austin, Texas). "Methods and techniques for real-ti... Read More
ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,219,885, issued on Feb. 4, was assigned to International Business Machines Corp. (Armonk, N.Y.). "Reducing contact resistance of phase change me... Read More
ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,216,009, issued on Feb. 4, was assigned to Siemens AG (Munich). "Arrangement and method for determining temperatures of electronic components" w... Read More